Atomic Force Microscope
An atomic force microscope is a source of high magnification scanning transmission electron microscopy with a precision of nanoscale dimension.
AFM microscopes are one of the finest tools for evaluating nanosized surface measurements and specimen properties of materials. A standard compound light microscope has a sufficiently large sample magnification of around 1:1000, which is determined by the visible region of the spectrum. This gives a precision of around 0.2 μm in diameter (m), which indicates that two locations nearer to each other than about 200 nm cannot be distinguished. The restrictions of this concentrating capacity are becoming obvious in the past few decades, especially since the introduction of advanced technologies such as scanning electron microscopy (SEM) and atomic force microscopy (AFM).
The Benefits of AFM:
- The atomic force microscope is a strong instrument that can accurately measure very tiny specimens.
- Despite existing techniques, it wouldn’t need a vacuum or the specimen to be exposed to potentially damaging treatment.
- However, at the limits of functionality, researchers have accomplished atomic resolution in a high vacuum but even in fluid settings.