Electron Backscatter Diffraction (EBSD)
Electron backscatter diffraction (EBSD) microscopy is a method being used with scanning electron microscopes (SEMs) to determine crystallographic characteristics in mineral and metal specimens.
EBSD Working Principle:
A static e – beam reacts with an inclined crystalline solid specimen, and the backscattered electrons create a shape that a fluorescent screening can recognize. The diffraction pattern indicates the crystal structure at the spot where the beam of electrons reacts with the specimen. As a result, the diffraction pattern may be employed to determine crystalline alignment, distinguish crystalline structure distinct stages, describe boundary layers, and offer details concerning localized crystallographic quality. The grain structure, alignments, and barriers are exposed when a beam of electrons is traced in a pattern over a polycrystalline material and the crystalline orientation is evaluated at every position.
EBSD Sample Preparation:
Typically, electron and optical microscopic studies start with a tiny piece of rock. Samples utilized for EBSD evaluations require significant preparation processes since grit-based polishing of specimens generates crystal defects in the highest layer that really should be eliminated to obtain quality patterns. Materials are included since this data is usually required, and must not be understood as product endorsements, equivalents and substitutes are obtainable.
